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1

Diffusion in yttrium aluminium garnet at the nanometer-scale: Insight into the effective grain boundary width

Marquardt, K., Ramasse, Q. M., Kisielowski, C., Wirth, R.

Journal:

American Mineralogist

Year:

2011

Language:

english

File:

PDF, 7.02 MB

english, 2011

2

Feynman diagrammatic approach to spinfoams

Kisielowski, Marcin, Lewandowski, Jerzy, Puchta, Jacek

Journal:

Classical and Quantum Gravity

Year:

2012

Language:

english

File:

PDF, 2.94 MB

english, 2012

3

Integral expression for a topological charge in the Faddeev–Niemi nonlinear sigma model

Kisielowski, Marcin

Journal:

Journal of Physics A Mathematical and Theoretical

Year:

2016

Language:

english

File:

PDF, 342 KB

english, 2016

4

Strain relaxation and dislocation filtering in metamorphic high electron mobility transistor structures grown on GaAs substrates

Lubyshev, D., Liu, W. K., Stewart, T. R., Cornfeld, A. B., Fang, X. M., Xu, X., Specht, P., Kisielowski, C., Naidenkova, M., Goorsky, M. S., Whelan, C. S., Hoke, W. E., Marsh, P. F., Mirecki Millunchi

Journal:

Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures

Year:

2001

Language:

english

File:

PDF, 794 KB

english, 2001

5

Structural Defects in Heteroepitaxial and Homoepitaxial GaN

Liliental-Weber, Zuzanna, Ruvimov, S., Kisielowski, CH., Chen, Y., Swider, W., Washburn, J., Newman, N., Gassmann, A., Liu, X., Schloss, L., Weber, E.R., Grzegory, I., Bockowski, M., Jun, J., Suski, T

Journal:

MRS Proceedings

Year:

1995

Language:

english

File:

PDF, 7.68 MB

english, 1995

6

Using a monochromator to improve the resolution in TEM to below 0.5 Å. Part II: Application to focal series reconstruction

P.C. Tiemeijer, M. Bischoff, B. Freitag, C. Kisielowski

Journal:

Ultramicroscopy

Year:

2012

Language:

english

File:

PDF, 3.07 MB

english, 2012

7

Application of Aberration-Corrected TEM and Image Simulation to Nanoelectronics and Nanotechnology

Korgel, Brian A., Lee, D. C., Hanrath, Tobias, Yacaman, Miguel Jos, Thesen, Alexander, Matijevic, Marco, Kilaas, Roar, Kisielowski, Christian, Diebold, Alain C.

Journal:

IEEE Transactions on Semiconductor Manufacturing

Year:

2006

Language:

english

File:

PDF, 1.68 MB

english, 2006

8

Defects in Two Dimensional Crystals: An Ultra-high Resolution Aberration-corrected Electron Microscopy Study

Alem, N., Louie, S., Zettl, A., Ramasse, Q., Yazyev, O., Seabourne, C., Scott, A., Kisielowski, C., Hartel, P., Jiang, B., Erni, R.

Journal:

Microscopy and Microanalysis

Year:

2012

File:

PDF, 546 KB

2012

9

Ultra-High-Resolution Transmission Electron Microscopy of Atomically Thin Hexagonal Boron Nitride (h-BN)

Alem, N, Erni, R, Kisielowski, C, Rossell, MD, Gannett, W, Zettl, A

Journal:

Microscopy and Microanalysis

Year:

2010

Language:

english

File:

PDF, 1.44 MB

english, 2010

10

FIB Preparation for HRTEM: GaN Based Devices

Jinschek, Joerg Ralf, Radmilovic, Velimir R, Kisielowski, Christian

Journal:

Microscopy and Microanalysis

Year:

2004

Language:

english

File:

PDF, 1.03 MB

english, 2004

11

Classification of Defects in Plastically Deformed Silicon

Kisielowski-Kemmerich, C., Czaschke, J., Alexander, H.

Journal:

Materials Science Forum

Year:

1986

File:

PDF, 346 KB

1986

12

Location of Co and Ni promoter atoms in multi-layer MoS2 nanocrystals for hydrotreating catalysis

Y. Zhu, Q. M. Ramasse, M. Brorson, P. G. Moses, L. P. Hansen, H. Topsøe, C. F. Kisielowski, S. Helveg

Year:

2015

Language:

english

File:

PDF, 2.73 MB

english, 2015

13

Quantitative Investigations of Interfaces and Grain Boundaries by Phase Contrast Electron Microscopy with Ultra High Resolution

Kisielowski, C., Plitzko, J.M., Lartigue, S., Radetic, T., Dahmen, U.

Journal:

Microscopy and Microanalysis

Year:

2001

File:

PDF, 1.06 MB

2001

14

Graphene at the Edge: Stability and Dynamics

Girit, C. O., Meyer, J. C., Erni, R., Rossell, M. D., Kisielowski, C., Yang, L., Park, C.-H., Crommie, M. F., Cohen, M. L., Louie, S. G., Zettl, A.

Journal:

Year:

2009

Language:

english

File:

PDF, 610 KB

english, 2009

15

ESR-Spectra of Defects in Plastically Deformed GaAs

Wattenbach, M., Krüger, Joachim, Kisielowski-Kemmerich, Christian, Alexander, H.

Journal:

Materials Science Forum

Year:

1989

File:

PDF, 359 KB

1989

16

Observation of Single Colloidal Platinum Nanocrystal Growth Trajectories

Zheng, H., Smith, R. K., Jun, Y.-w., Kisielowski, C., Dahmen, U., Alivisatos, A. P.

Journal:

Year:

2009

Language:

english

File:

PDF, 449 KB

english, 2009

17

Distortion and Segregation in a Dislocation Core Region at Atomic Resolution

Xu, X., Beckman, S. P., Specht, P., Weber, E. R., Chrzan, D. C., Erni, R. P., Arslan, I., Browning, N., Bleloch, A., Kisielowski, C.

Journal:

Physical Review Letters

Year:

2005

Language:

english

File:

PDF, 538 KB

english, 2005

18

Atomic-Resolution Imaging with a Sub-50-pm Electron Probe

Erni, Rolf, Rossell, Marta D., Kisielowski, Christian, Dahmen, Ulrich

Journal:

Physical Review Letters

Year:

2009

Language:

english

File:

PDF, 549 KB

english, 2009

19

Controlling electron beam-induced structure modifications and cation exchange in cadmium sulfide–copper sulfide heterostructured nanorods

Zheng, Haimei, Sadtler, Bryce, Habenicht, Carsten, Freitag, Bert, Alivisatos, A. Paul, Kisielowski, Christian

Journal:

Ultramicroscopy

Year:

2013

Language:

english

File:

PDF, 4.83 MB

english, 2013

20

Using a monochromator to improve the resolution in TEM to below 0.5 Å. Part I: Creating highly coherent monochromated illumination

P.C. Tiemeijer, M. Bischoff, B. Freitag, C. Kisielowski

Journal:

Ultramicroscopy

Year:

2012

Language:

english

File:

PDF, 1.37 MB

english, 2012

21

Atomic Resolution Imaging of Halide Perovskites

Yu, Yi, Zhang, Dandan, Kisielowski, Christian, Dou, Letian, Kornienko, Nikolay, Bekenstein, Yehonadav, Wong, Andrew B., Alivisatos, A. Paul, Yang, Peidong

Journal:

Year:

2016

Language:

english

File:

PDF, 5.57 MB

english, 2016

22

[Semiconductors and Semimetals] Gallium Nitride (GaN) II Volume 57 || Chapter 7 Strain in GaN Thin Films and Heterostructures

Kisielowski, Christian

Year:

1998

Language:

english

File:

PDF, 4.32 MB

english, 1998

23

Structural characterization of bulk GaN crystals grown under high hydrostatic pressure

Zuzanna Liliental-Weber, C. Kisielowski, S. Ruvimov, Y. Chen, J. Washburn, I. Grzegory, M. Bockowski, J. Jun, S. Porowski

Journal:

Journal of Electronic Materials

Year:

1996

Language:

english

File:

PDF, 2.08 MB

english, 1996

24

Stress Gradients In Heteroepitaxial Gallium Nitride Films

Ager, J. W., Conti, G., Romano, L. T., Kisielowski, C.

Journal:

MRS Proceedings

Year:

1997

Language:

english

File:

PDF, 1.59 MB

english, 1997

25

Homoepitaxial growth of GaN using molecular beam epitaxy

Gassmann, A., Suski, T., Newman, N., Kisielowski, C., Jones, E., Weber, E. R., Liliental‐Weber, Z., Rubin, M. D., Helava, H. I., Grzegory, I., Bockowski, M., Jun, J., Porowski, S.

Journal:

Journal of Applied Physics

Year:

1996

Language:

english

File:

PDF, 419 KB

english, 1996

26

Probing the Out-of-Plane Distortion of Single Point Defects in Atomically Thin Hexagonal Boron Nitride at the Picometer Scale

Alem, Nasim, Yazyev, Oleg V., Kisielowski, Christian, Denes, P., Dahmen, Ulrich, Hartel, Peter, Haider, Maximilian, Bischoff, Maarten, Jiang, Bin, Louie, Steven G., Zettl, A.

Journal:

Physical Review Letters

Year:

2011

Language:

english

File:

PDF, 651 KB

english, 2011

27

ngstrom imaging of reversible and irreversible conformations in rhodium catalysts and graphene

Kisielowski, Christian, Wang, Lin-Wang, Specht, Petra, Calderon, Hector A., Barton, Bastian, Jiang, Bin, Kang, Joo H., Cieslinski, Robert

Journal:

Physical Review B

Year:

2013

Language:

english

File:

PDF, 3.55 MB

english, 2013

28

Investigations of well defined dislocations in silicon

H. Alexander, C. Kisielowski-Kemmerich, E.R. Weber

Journal:

Year:

1983

Language:

english

File:

PDF, 854 KB

english, 1983

29

Structural Features in the Photoluminescence from Widely Dissociated Straight Partial Dislocations in Silicon

Sauer, R., Alexander, H., Kisielowski-Kemmerich, Christian

Journal:

Materials Science Forum

Year:

1986

File:

PDF, 355 KB

1986

30

Object-defined Resolution Below 0.5Å in Transmission Electron Microscopy - Recent Advances on the TEAM 0.5 Instrument

Kisielowski, C, Erni, R, Freitag, B

Journal:

Microscopy and Microanalysis

Year:

2008

Language:

english

File:

PDF, 341 KB

english, 2008

31

[ECS 209th ECS Meeting - Denver, Colorado (May 7-May 12, 2006)] ECS Transactions - Analysis of Nanoscale Stress in Strained Silicon Materials and Microelectronics Devices by Energy-Filtered Convergent Beam Electron Diffraction

Zhang, Peng, Istratov, Andrei, He, Haifeng, Ager, Joel, Nelson, Chris, Stach, Eric, Mardinly, John, Kisielowski, Christian, Weber, Eicke, Spence, John

Year:

2006

Language:

english

File:

PDF, 1.08 MB

english, 2006

32

Photoluminescence of Strain-Engineered MBE-Grown GaN and InGaN Quantum Well Structures

Krüger, Joachim, Kisielowski, Christian, Klockenbrink, Ralf, Sudhir, G. S., Kim, Yihwan, Rubin, Michael, Weber, Eicke R.

Journal:

MRS Proceedings

Year:

1997

Language:

english

File:

PDF, 415 KB

english, 1997

33

Electron Tomography of Microelectronic Device Interconnects

Yang, Q, Mardinly, J, Kübel, C, Nelson, C, Kisielowski, C

Journal:

Microscopy and Microanalysis

Year:

2005

Language:

english

File:

PDF, 260 KB

english, 2005

34

Direct Imaging of Rhodium Crystal Surface Structures with Signal Recovery by Low Dose Microscopy

Specht, P, Barton, D, Kang, J, Cieslinski, R, Dubon, O, Kisielowski, C

Journal:

Microscopy and Microanalysis

Year:

2011

Language:

english

File:

PDF, 793 KB

english, 2011

35

Electron Microscopy Studies of Structure and Dynamics in MoS2-based Hydrodesulfurization Catalysts

Hansen, Lars P., Johnson, Erik, Ramasse, Quentin M., Kisielowski, Christian, Brorson, Michael, Helveg, Stig

Journal:

Microscopy and Microanalysis

Year:

2014

Language:

english

File:

PDF, 2.78 MB

english, 2014

36

Retardation, Surface and Interface Effects in VEELS

Erni, R, Browning, ND, Specht, P, Kisielowski, C

Journal:

Microscopy and Microanalysis

Year:

2007

Language:

english

File:

PDF, 534 KB

english, 2007

37

SPIE Proceedings [SPIE OPTO - San Francisco, California (Saturday 23 January 2010)] Quantum Sensing and Nanophotonic Devices VII - Composition and strain mapping of interfaces in InAs/GaSb superlattices by aberration-corrected high-resolution transmission electron microscopy

Mahalingam, K., Razeghi, Manijeh, Sudharsanan, Rengarajan, Haugan, H. J., Brown, G. J., Brown, Gail J., Eyink, K. G., Szmulowicz, F., Jiang, Bin, Kisielowski, C. F.

Year:

2010

Language:

english

File:

PDF, 4.54 MB

english, 2010

38

Electron Microscopy of Heterostructure for Solar Energy Recovery: ZnO Nanowires and Co3O4 Nanoparticles

Cigarroa-Mayorga, O., Neri, E., Calderon, H. A., Kisielowski, C.

Journal:

Microscopy and Microanalysis

Year:

2017

Language:

english

File:

PDF, 448 KB

english, 2017

39

Investigation of clinicopathological parameters and expression of COX-2, bcl-2, PCNA, and p53 in primary and recurrent sporadic odontogenic keratocysts

Kaczmarzyk, Tomasz, Kisielowski, Konrad, Koszowski, Rafał, Rynkiewicz, Magdalena, Gawełek, Ewa, Babiuch, Karolina, Bednarczyk, Anna, Drozdzowska, Bogna

Journal:

Clinical Oral Investigations

Year:

2018

Language:

english

File:

PDF, 1.32 MB

english, 2018

40

Control of the structure and surface morphology of gallium nitride and aluminum nitride thin films by nitrogen background pressure in pulsed laser deposition

G. S. Sudhir, H. Fujii, W. S. Wong, C. Kisielowski, N. Newman, C. Dieker, Z. Liliental-Weber, M. D. Rubin, E. R. Weber

Journal:

Journal of Electronic Materials

Year:

1998

Language:

english

File:

PDF, 1.20 MB

english, 1998

41

Vacancy growth and migration dynamics in atomically thin hexagonal boron nitride under electron beam irradiation

Nasim Alem, Rolf Erni, Christian Kisielowski, Marta D. Rossell, Peter Hartel, Bin Jiang, Will Gannett, A. Zettl

Journal:

physica status solidi (RRL) - Rapid Research Letters

Year:

2011

Language:

english

File:

PDF, 655 KB

english, 2011

42

Scanning Tunneling Microscopy of Crystal Dislocations in Gallium Arsenide

Cox, G., Szynka, D., Poppe, U., Graf, K. H., Urban, K., Kisielowski-Kemmerich, C., Krüger, J., Alexander, H.

Journal:

Physical Review Letters

Year:

1990

File:

PDF, 28 KB

1990

43

Instrumental requirements for the detection of electron beam-induced object excitations at the single atom level in high-resolution transmission electron microscopy

Kisielowski, C., Specht, P., Gygax, S.M., Barton, B., Calderon, H.A., Kang, J.H., Cieslinski, R.

Journal:

Year:

2015

Language:

english

File:

PDF, 4.14 MB

english, 2015

44

Maintaining the genuine structure of 2D materials and catalytic nanoparticles at atomic resolution

Calderon, H.A., Kisielowski, C., Specht, P., Barton, B., Godinez-Salomon, F., Solorza-Feria, O.

Journal:

Year:

2015

Language:

english

File:

PDF, 7.03 MB

english, 2015

45

Subangstrom Edge Relaxations Probed by Electron Microscopy in Hexagonal Boron Nitride

Alem, Nasim, Ramasse, Quentin M., Seabourne, Che R., Yazyev, Oleg V., Erickson, Kris, Sarahan, Michael C., Kisielowski, Christian, Scott, Andrew J., Louie, Steven G., Zettl, A.

Journal:

Physical Review Letters

Year:

2012

Language:

english

File:

PDF, 2.58 MB

english, 2012

46

High-Resolution Interface Atomic Structure Analysis in Silicon Nitride Ceramics

Ziegler, A., Idrobo, J. C., Cinibulk, M. K., Kisielowski, C., Browning, N. D., Ritchie, R. O.

Journal:

MRS Proceedings

Year:

2004

Language:

english

File:

PDF, 4.16 MB

english, 2004

47

Analysis of Nano-scale Strain Near Shallow Trench Isolation Structures by Energy-filtered Convergent Beam Electron Diffraction

Zhang, P, Mardinly, J, Karpenko, O, Istratov, A, He, H, Ager, J, Nelson, C, Stach, E, Kisielowski, C, Weber, E, Spence, J

Journal:

Microscopy and Microanalysis

Year:

2006

Language:

english

File:

PDF, 701 KB

english, 2006

48

Chemical Composition and Thickness Retrieval in HRTEM by a Reversed Multislice Process

Chen, F-R, Kisielowski, C F, Jinschek, J R, Plitzko, J, Kai, J-J

Journal:

Microscopy and Microanalysis

Year:

2005

Language:

english

File:

PDF, 1.39 MB

english, 2005

49

The challenge of imaging hard/soft matter interfaces at atomic resolution

Barton, B., Buonsanti, R., Dong, A., Milliron, D., Kisielowski, C.F., Hansen, L.P., Helveg, S., Jiang, B.

Journal:

Microscopy and Microanalysis

Year:

2012

Language:

english

File:

PDF, 799 KB

english, 2012

50

X-Ray Photoemission Spectromicroscopy Of Gan And AIGan

Lorusso, G. F., Solak, H., Cerrina, F., Underwood, J. H., Batson, P. J., Kim, Y., Cho, Y., Kisielowski, C., Krueger, J., Weber, E. R.

Journal:

MRS Proceedings

Year:

1998

Language:

english

File:

PDF, 3.11 MB

english, 1998

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